Connector Reliability Testing: Noise Spectral Analysis

Abstract

The large contribution of connectors to electronic systems unreliability is widely recognized. On the other hand there is even uncertainty about how best to define contact failure. However since connnector reliability test must ultimately match the needs of the electronics which will use these connectors. Testing methods can be meaningfully viewed from the electronics perspective, treating the connectors as 'black box". In this sense a research has been developed based on the contact resistance measurements and on the spectral analysis of the voltage drops while passing d.c. current when the contact is activated in its typical working conditions that is subjected to mechanical vibrations and to thermal fatiques.