Comparison of microvia HDI PCBs with ACF interconnections in accelerated life testing

L. Frisk, S. Lahokallio, J. Kiilunen
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引用次数: 1

Abstract

New packaging technologies require high density substrates. In built up high density interconnect (HDI) printed circuit boards (PCB) high density is achieved by using microvias. Such HDI PCBs may be used in many applications. In flip chip technology, a bare chip is attached directly to a substrate which enables very high density. Anisotropic conductive adhesive films (ACF) are often used as interconnection materials in high density flip chip applications, since they enable very high density. In this study, the reliability of flip chip ACF attachments on four different HDI PCBs was studied. The PCBs had similar core layers, but the microvia layers of the PCBs were different. Test chips were attached on these PCBs using an ACF. The reliability of the interconnections was tested using two fast thermal cycling tests and a constant humidity test. Several failures were seen with all PCB materials during the tests. However, no significant differences in the reliability of the different microvia layers was seen. Consequently, the composition of the microvia layer was not found to be critical to the reliability of the ACF interconnections.
微孔HDI pcb与ACF互连在加速寿命测试中的比较
新的封装技术需要高密度的基板。在高密度互连(HDI)印刷电路板(PCB)中,高密度是通过使用微过孔实现的。这种HDI pcb可用于许多应用。在倒装芯片技术中,裸芯片直接附着在基板上,从而实现非常高的密度。各向异性导电胶膜(ACF)通常用作高密度倒装芯片应用中的互连材料,因为它们可以实现非常高的密度。在本研究中,我们研究了倒装ACF附件在四种不同HDI pcb上的可靠性。pcb具有相似的核心层,但pcb的微孔层不同。使用ACF将测试芯片连接到这些pcb上。通过两次快速热循环试验和一次恒湿试验对互连的可靠性进行了测试。在测试过程中,所有PCB材料都出现了一些故障。然而,不同微孔层的可靠性没有显著差异。因此,微孔层的组成并不是ACF互连可靠性的关键。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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