{"title":"A complete measurement Test-Set for non-linear device characterization","authors":"A. Ferrero, V. Teppati","doi":"10.1109/ARFTG.2001.327494","DOIUrl":null,"url":null,"abstract":"A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
Abstract
A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.