{"title":"Radiated electromagnetic fields of actual devices measured in different test environments","authors":"F. Leferink, G. Hilverda, D. Boerle, W. van Etten","doi":"10.1109/ISEMC.2003.1236663","DOIUrl":null,"url":null,"abstract":"Correction factors between test sites are conventionally based on the antenna pattern of a tuned 1/2 /spl lambda/ dipole. Actual devices show diverse antenna patterns and correlation between results obtained at different test sites fails. This is shown in this paper using an Open Area Test Site, a Semi-Anechoic Chamber, a Full Anechoic Chamber and a Reverberating Intrinsic Reverberation Chamber for emission measurements between 20 MHz and 1 GHz. Differences between the sites of more than 40 dB can be observed.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":" 37","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Correction factors between test sites are conventionally based on the antenna pattern of a tuned 1/2 /spl lambda/ dipole. Actual devices show diverse antenna patterns and correlation between results obtained at different test sites fails. This is shown in this paper using an Open Area Test Site, a Semi-Anechoic Chamber, a Full Anechoic Chamber and a Reverberating Intrinsic Reverberation Chamber for emission measurements between 20 MHz and 1 GHz. Differences between the sites of more than 40 dB can be observed.