Using Formal Methods to Evaluate Hardware Reliability in the Presence of Soft Errors

Bing Xue, Mark Zwolinski
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Abstract

Reliability is a major concern in many embedded systems. Redundancy-based methods are widely used against Single Event Upsets, causing significant temporal and spatial overhead. The traditional method to evaluate the reliability of a system is fault injection. However, it is practically impossible to test all faults for a complex design due to intractable simulation times. In this paper, we propose using formal methods to evaluate hardware reliability in the presence of soft errors. The proposed method can exhaustively search the entire state space and the whole fault list in a reasonable time. The method is applied to assess the vulnerability of all registers in a RISC-V Ibex core.
采用形式化方法评估存在软错误的硬件可靠性
可靠性是许多嵌入式系统的主要关注点。基于冗余的方法被广泛用于对抗单事件干扰,这会造成巨大的时间和空间开销。评估系统可靠性的传统方法是故障注入。然而,由于难以控制的仿真时间,实际上不可能对复杂设计的所有故障进行测试。在本文中,我们建议使用形式化方法来评估存在软错误的硬件可靠性。该方法可以在合理的时间内对整个状态空间和整个故障列表进行穷尽搜索。将该方法应用于RISC-V Ibex内核中所有寄存器的漏洞评估。
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