Qiren Chen, Hua Li, Lu Li, Haoyu Jiang, Yi Liu, Qin Zhang, Fuchang Lin, Chenchen Zhang
{"title":"Moisture Ingress of Metallized Film Capacitor under High Temperature and Different Humidity Condition","authors":"Qiren Chen, Hua Li, Lu Li, Haoyu Jiang, Yi Liu, Qin Zhang, Fuchang Lin, Chenchen Zhang","doi":"10.1109/CEIDP.2018.8544882","DOIUrl":null,"url":null,"abstract":"Moisture accelerates the accelerated of metallized film capacitors. The moisture ingreessed to capacitor leads to corrosion of electrode, and increasing of capacitor loss. In this paper, the electrode corrosion and moisture ingress process of metallized film capacitors(MFC) were studied under high temperature and different humidity conditions. Damp-heat ageing test platform for capacitor was established for the study. Three groups of metallized film capacitors have been stressed under an applied voltage of 305 Vac at 85 °C and 85 %R.H., 60 %R.H., 35 %R.H., respectively. After 716.5 h of experiment, at 85 %R.H., the average AC % dropped by 70.35 %, tanδ risen to 0.01685, at 35 %R.H., the average AC % dropped by 3.81 %, tanδ risen to 0.00082 The moisture ingress process was studied in this paper. Experment results indicated that Corrosion occurs at multiple locations on the electrode at the same time, if there is a lot of moisture inside the capacitor. And the IR calculations match well with the experimental results.","PeriodicalId":377544,"journal":{"name":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"176 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2018.8544882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Moisture accelerates the accelerated of metallized film capacitors. The moisture ingreessed to capacitor leads to corrosion of electrode, and increasing of capacitor loss. In this paper, the electrode corrosion and moisture ingress process of metallized film capacitors(MFC) were studied under high temperature and different humidity conditions. Damp-heat ageing test platform for capacitor was established for the study. Three groups of metallized film capacitors have been stressed under an applied voltage of 305 Vac at 85 °C and 85 %R.H., 60 %R.H., 35 %R.H., respectively. After 716.5 h of experiment, at 85 %R.H., the average AC % dropped by 70.35 %, tanδ risen to 0.01685, at 35 %R.H., the average AC % dropped by 3.81 %, tanδ risen to 0.00082 The moisture ingress process was studied in this paper. Experment results indicated that Corrosion occurs at multiple locations on the electrode at the same time, if there is a lot of moisture inside the capacitor. And the IR calculations match well with the experimental results.