Moisture Ingress of Metallized Film Capacitor under High Temperature and Different Humidity Condition

Qiren Chen, Hua Li, Lu Li, Haoyu Jiang, Yi Liu, Qin Zhang, Fuchang Lin, Chenchen Zhang
{"title":"Moisture Ingress of Metallized Film Capacitor under High Temperature and Different Humidity Condition","authors":"Qiren Chen, Hua Li, Lu Li, Haoyu Jiang, Yi Liu, Qin Zhang, Fuchang Lin, Chenchen Zhang","doi":"10.1109/CEIDP.2018.8544882","DOIUrl":null,"url":null,"abstract":"Moisture accelerates the accelerated of metallized film capacitors. The moisture ingreessed to capacitor leads to corrosion of electrode, and increasing of capacitor loss. In this paper, the electrode corrosion and moisture ingress process of metallized film capacitors(MFC) were studied under high temperature and different humidity conditions. Damp-heat ageing test platform for capacitor was established for the study. Three groups of metallized film capacitors have been stressed under an applied voltage of 305 Vac at 85 °C and 85 %R.H., 60 %R.H., 35 %R.H., respectively. After 716.5 h of experiment, at 85 %R.H., the average AC % dropped by 70.35 %, tanδ risen to 0.01685, at 35 %R.H., the average AC % dropped by 3.81 %, tanδ risen to 0.00082 The moisture ingress process was studied in this paper. Experment results indicated that Corrosion occurs at multiple locations on the electrode at the same time, if there is a lot of moisture inside the capacitor. And the IR calculations match well with the experimental results.","PeriodicalId":377544,"journal":{"name":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"176 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2018.8544882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Moisture accelerates the accelerated of metallized film capacitors. The moisture ingreessed to capacitor leads to corrosion of electrode, and increasing of capacitor loss. In this paper, the electrode corrosion and moisture ingress process of metallized film capacitors(MFC) were studied under high temperature and different humidity conditions. Damp-heat ageing test platform for capacitor was established for the study. Three groups of metallized film capacitors have been stressed under an applied voltage of 305 Vac at 85 °C and 85 %R.H., 60 %R.H., 35 %R.H., respectively. After 716.5 h of experiment, at 85 %R.H., the average AC % dropped by 70.35 %, tanδ risen to 0.01685, at 35 %R.H., the average AC % dropped by 3.81 %, tanδ risen to 0.00082 The moisture ingress process was studied in this paper. Experment results indicated that Corrosion occurs at multiple locations on the electrode at the same time, if there is a lot of moisture inside the capacitor. And the IR calculations match well with the experimental results.
高温和不同湿度条件下金属化膜电容器的吸湿特性
水分加速了金属化薄膜电容器的加速。水分进入电容器,导致电极腐蚀,电容器损耗增大。本文研究了金属化薄膜电容器(MFC)在高温和不同湿度条件下的电极腐蚀和吸湿过程。为此,建立了电容湿热老化试验平台。三组金属化薄膜电容器在305 Vac、85°C、85% R.H.的外加电压下受力, 60% r.h.。, 35% r.h.。,分别。实验716.5 h后,在85% rh下,平均AC %下降70.35%,tanδ上升到0.01685,在35% R.H.,平均AC %下降3.81%,tanδ上升至0.00082,本文研究了吸湿过程。实验结果表明,如果电容器内部有大量的水分,则电极上的多个位置同时发生腐蚀。红外计算结果与实验结果吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信