An accurate current reference using temperature and process compensation current mirror

Byung‐Do Yang, Young-Kyu Shin, Jee-Sue Lee, Yong-Kyu Lee, K. Ryu
{"title":"An accurate current reference using temperature and process compensation current mirror","authors":"Byung‐Do Yang, Young-Kyu Shin, Jee-Sue Lee, Yong-Kyu Lee, K. Ryu","doi":"10.1109/ASSCC.2009.5357223","DOIUrl":null,"url":null,"abstract":"In this paper, an accurate current reference using temperature and process compensation current mirror (TPC-CM) is proposed. The temperature independent reference current is generated by summing a proportional to absolute temperature (PTAT) current and a complementary to absolute temperature (CTAT) current. The temperature coefficient and magnitude of the reference current are influenced by the process variation. To calibrate the process variation, the proposed TPC-CM uses two binary weighted current mirrors which control the temperature coefficient and magnitude of the reference current. After the PTAT and CTAT currents are measured, the switch codes of the TPC-CM are fixed in order that the magnitude of reference current is independent to temperature. And, the codes are stored in the non-volatile memory. In the simulation, the effect of the process variation is reduced to 0.52% from 19.7% after the calibration using a TPC-CM in chip-by-chip. A current reference chip is fabricated with a 3.3V 0.35um CMOS process. The measured calibrated reference current has 0.42% variation.","PeriodicalId":263023,"journal":{"name":"2009 IEEE Asian Solid-State Circuits Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"53","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2009.5357223","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 53

Abstract

In this paper, an accurate current reference using temperature and process compensation current mirror (TPC-CM) is proposed. The temperature independent reference current is generated by summing a proportional to absolute temperature (PTAT) current and a complementary to absolute temperature (CTAT) current. The temperature coefficient and magnitude of the reference current are influenced by the process variation. To calibrate the process variation, the proposed TPC-CM uses two binary weighted current mirrors which control the temperature coefficient and magnitude of the reference current. After the PTAT and CTAT currents are measured, the switch codes of the TPC-CM are fixed in order that the magnitude of reference current is independent to temperature. And, the codes are stored in the non-volatile memory. In the simulation, the effect of the process variation is reduced to 0.52% from 19.7% after the calibration using a TPC-CM in chip-by-chip. A current reference chip is fabricated with a 3.3V 0.35um CMOS process. The measured calibrated reference current has 0.42% variation.
一个精确的电流参考使用温度和过程补偿电流镜
本文提出了一种采用温度和工艺补偿电流反射镜(TPC-CM)的精确电流基准。与温度无关的参考电流由与绝对温度(PTAT)成比例的电流和与绝对温度(CTAT)互补的电流之和产生。温度系数和参考电流的大小受工艺变化的影响。为了校准过程变化,所提出的TPC-CM使用两个二元加权电流镜来控制温度系数和参考电流的大小。测量完PTAT和CTAT电流后,固定TPC-CM的开关码,使参考电流的大小与温度无关。并且,所述代码存储在所述非易失性存储器中。在模拟中,使用TPC-CM逐片校准后,工艺变化的影响从19.7%降低到0.52%。采用3.3V 0.35um CMOS工艺制作了电流参考芯片。测量的校准基准电流有0.42%的变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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