A new 1200 V-class edge termination structure with trench double field plates for high dV/dt performance

Wentao Yang, Hao Feng, Yong Liu, Xiangming Fang, Y. Onozawa, Hiroyuki Tanaka, Kaname Mitsuzuka, J. Sin
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引用次数: 4

Abstract

In this paper, a new 1200 V-class edge termination structure with trench double field plates is proposed and experimentally demonstrated. The double field plates are buried inside the trench. One of the field plates is for modulating electric field distributions along the trench and shifting the breakdown point to the active region for achieving the ideal planar junction breakdown voltage, and the other one is for stopping the depletion region extension at the right side of the trench to achieve high dV/dt performance. The fabricated device has a breakdown voltage of 1422 V which is verified as the ideal planar junction breakdown voltage. Furthermore, it is with a record-short edge termination length of 78 μm which is less than one-fifth of conventional guard ring approaches. Besides, it can handle a high dV/dt value of 73 kV/μs even at a bus voltage of 1400 V.
新型1200v级边缘端接结构,采用沟槽双场板,具有高dV/dt性能
本文提出了一种新型的带沟槽双场板的1200v级边缘端接结构,并进行了实验验证。双场板埋在沟内。其中一块场板用于调制沿沟槽的电场分布,将击穿点移至有源区,以获得理想的平面结击穿电压;另一块场板用于阻止耗尽区向沟槽右侧延伸,以获得较高的dV/dt性能。该器件的击穿电压为1422 V,是理想的平面结击穿电压。此外,它具有创纪录的78 μm的边缘终止长度,小于传统保护环方法的五分之一。在母线电压为1400 V时,也能承受73 kV/μs的高dV/dt值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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