Design and analysis of FINFET pass transistor based XOR and XNOR circuits at 45 nm technology

N. Yadav, S. Khandelwal, S. Akashe
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引用次数: 15

Abstract

The conventional single-gate MOSFETs faces great challenges in scaling down of devices due to the severe short-channel effects that reason an exponential gain in the leakage current. To minimize the short channel effect Double-gate FinFET can be used in place of conventional MOSFET circuits because of the self-alignment of the two gates. Design of XOR and XNOR circuits is suggested to improve the speed and power of these circuits and is basic building block of many arithmetic circuits. This paper compares and evaluates the performance of various designs of pass transistor based XOR and XNOR circuits. This paper demonstrates comparative performance study of high speed, low power and low voltage on XOR and XNOR digital circuit. The performances of XOR and XNOR circuits are based on CADANCE VIRTUOSO tool at 45 nm by applying voltage supply 0.7 voltages and the temperate is 27°C. Simulation results reveal low power, delay, power, delay product (PDP), average dynamic power consumption, energy delay product (EDP).
基于45纳米技术的XOR和XNOR电路的FINFET通管设计与分析
由于严重的短通道效应导致漏电流呈指数级增长,传统的单栅mosfet在器件缩小方面面临巨大挑战。为了最大限度地减少短通道效应,双栅极FinFET可以用来代替传统的MOSFET电路,因为两个栅极的自对准。建议设计异或和异或电路,以提高这些电路的速度和功率,是许多算术电路的基本组成部分。本文比较和评价了基于通型晶体管的各种异或与非或电路设计的性能。本文对异或与异或数字电路进行了高速、低功耗、低电压的性能对比研究。XOR和XNOR电路的性能基于CADANCE VIRTUOSO工具,在45 nm处施加0.7电压,温度为27°C。仿真结果揭示了低功耗、延迟、功率、延迟积(PDP)、平均动态功耗、能量延迟积(EDP)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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