Precise dielectric properties determination of laminar-shaped materials in a partially-filled waveguide

Abstract

An enhanced technique for complex dielectric properties characterization of laminar-shaped materials is presented. The technique is based upon scattering measurements of a partially-filled rectangular waveguide. The influence of the different parameters regarding the achievable accuracy have also been analyzed in order to determine the optimum sample configuration. Measurements of some commercial dielectric substrates used for printed antenna design were performed and have been used for validation purposes.