A statistical model for fault coverage analysis

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208163

C. Chen, N. Soong

引用次数: 1

Abstract

The authors present a statistical model for the evaluation of test coverage for both single-stuck-at and multiple-stuck-at faults. The model parameters are the node fault complexity and test frequency. For multiple fault detection, the model is applied to calculate the defect level of a production test.<>

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故障覆盖分析的统计模型

作者提出了一个评估单卡故障和多卡故障测试覆盖率的统计模型。模型参数为节点故障复杂度和测试频率。对于多故障检测，应用该模型计算生产测试的缺陷等级。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

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