{"title":"Development of a fault isolation procedure [space station reliability]","authors":"L.L. Means","doi":"10.1109/RAMS.1996.500648","DOIUrl":null,"url":null,"abstract":"A fault isolation procedure (FIP) was developed using a flow process in order to isolate a leak in the thermal control system (TCS) of the International Space Station Alpha. The FIP developed isolates the leak in less than three hours, while allowing for a rapid restoration of life and station critical functions. The FIP was also used to generate fault isolation times for repairable/replaceable units of the TCS. Documentation of an FIP in a process flow allows for less confusion in following instructions, making easier decisions and generating detailed fault isolation times. The flow process illustrated can be applied to any program in which a FIP is needed.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1996.500648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A fault isolation procedure (FIP) was developed using a flow process in order to isolate a leak in the thermal control system (TCS) of the International Space Station Alpha. The FIP developed isolates the leak in less than three hours, while allowing for a rapid restoration of life and station critical functions. The FIP was also used to generate fault isolation times for repairable/replaceable units of the TCS. Documentation of an FIP in a process flow allows for less confusion in following instructions, making easier decisions and generating detailed fault isolation times. The flow process illustrated can be applied to any program in which a FIP is needed.