Deeply Subwavelength Topological Microscopy

2021 Conference on Lasers and Electro-Optics (CLEO) Pub Date : 2021-05-01 DOI:10.1364/cleo_qels.2021.ftu4f.2

T. Pu, J. Ou, G. Yuan, E. Rogers, N. Papasimakis, P. Smith, N. Zheludev

引用次数: 0

Abstract

We demonstrate experimentally imaging resolution exceeding λ/20 by a new far-field and label-free approach based on illumination with topologically structured light fields and artificial intelligence. Further improvements promise resolution beyond λ/100.

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深度亚波长拓扑显微镜

我们通过实验证明了一种基于拓扑结构光场和人工智能照明的新型远场无标签方法的成像分辨率超过λ/20。进一步的改进有望使分辨率超过λ/100。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2021 Conference on Lasers and Electro-Optics (CLEO)

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