Application of nanosecond electron pulses to determine electrical properties of semiconductors

J.W. Leonhardt, R. Goeldner, J. Boes, R. Mehnert
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Abstract

p+-i-n+-diodes were irradiated by means of 10 ns-electron pulses with energies of 0.3 - 1 MeV. The induced current pulse was measured. The half times of growth and decay give information about electrical carrier life times and diffusion lengths.

纳秒级电子脉冲测定半导体电性能的应用
用10 ns电子脉冲辐照p+-i-n+-二极管,脉冲能量为0.3 - 1 MeV。测量了感应电流脉冲。生长和衰减的半衰期给出了载流子寿命和扩散长度的信息。
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