Electronic Device Failure Analysis

Electronic Device Failure Analysis
ISSN:
print: 1537-0755
研究领域:
Engineering-Safety, Risk, Reliability and Quality
Gold OA文章占比:
0.00%
原创研究文献占比:
0.00%
SCI收录类型:
Scopus (CiteScore)
期刊介绍英文:
Electronic Device Failure Analysis is a growing technical resource for the Failure Analysis engineer. Each quarterly issue covers: - Contributed technical articles that cover everything from operations to techniques - Insight into trends in the microelectronics FA industry, to keep you up-to-date - New product announcements - Recognition of outstanding contributions to the field of FA - Looking to update some skills? The Training Calendar provides an easy way to know what courses are coming up in the months ahead. - News of the Electronic Device Failure Analysis Society. - Guest Columns provide that vital perspective into other FA
CiteScore:
CiteScoreSJRSNIPCiteScore排名
0.60.1250.211
学科
排名
百分位
大类:Engineering
小类:Safety, Risk, Reliability and Quality
175 / 207
15%
大类:Engineering
小类:Electrical and Electronic Engineering
698 / 797
12%
发文信息
历年影响因子
历年发表
投稿信息
出版国家(地区):
United States
出版商:
ASM International
免责声明:
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