2010 IEEE International Reliability Physics Symposium

查看最新文献

1733

2010 IEEE International Reliability Physics Symposium - 最新文献

Energy resolved spin dependent trap assisted tunneling investigation of SILC related defects

Pub Date : 2010-05-02 DOI: 10.1109/IRPS.2010.5488660 Jason T. Ryan, P. Lenahan, Anand T. Krishnan, Srikanth Krishnan

Effect of multiple-transistor charge collection on SET pulse widths

Pub Date : 2010-05-02 DOI: 10.1109/IRPS.2010.5488828 J. Ahlbin, M. Gadlage, N. Atkinson, Bharat L. Bhuva, A. Witulski, W. T. Holman, Lloyd W. Massengill, P. Eaton, B. Narasimham

Understanding noise measurements in MOSFETs: the role of traps structural relaxation

Pub Date : 2010-05-02 DOI: 10.1109/IRPS.2010.5488850 D. Veksler, G. Bersuker, S. Rumyantsev, M. Shur, H. Park, C. Young, K. Lim, W. Taylor, R. Jammy

查看全部

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。