2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts

Improved Micro-Contact Resistance Model that Considers Material Deformation, Electron Transport and Thin Film Characteristics

Pub Date : 2009-10-09 DOI: 10.1109/HOLM.2009.5284384 Ronald A. Coutu Jr., J. McBride, L. Starman

An Experimental Study on Influences of Silicon-Type and Non-Silicone-Type Polymeric Cured Materials on Contact Resistance Characteristics of Relay Contacts

Pub Date : 2009-10-09 DOI: 10.1109/HOLM.2009.5284390 M. Hasegawa, Y. Kohno, H. Ando

A Method for Residential Series Arc Fault Detection and Identification

Pub Date : 2009-10-09 DOI: 10.1109/HOLM.2009.5284428 Dongwei Li, Zhengxiang Song, Jianhua Wang, Yingsan Geng, Huilin Chen, Li Yu, Bo Liu