2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)
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2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - 最新文献

SEU and TID testing of the Samsung 128 Mbit and the Toshiba 256 Mbit flash memory

Pub Date : 2000-07-24 DOI: 10.1109/REDW.2000.896277 D. Roth, J. Kinnison, B. Carkhuff, J.R. Lander, G.S. Bognaski, K. Chao, G. Swift

EXEQ I-IV: SEE in-flight measurement on the MIR orbital station

Pub Date : 2000-07-24 DOI: 10.1109/REDW.2000.896276 D. Falguère, S. Duzellier, R. Ecoffet, I. Tsourilo
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