2019 IEEE International Test Conference India (ITC India)

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2019 IEEE International Test Conference India (ITC India) - 最新文献

Leveraging IEEE 1850 PSL and Mixed-Signal Assertions for Post-silicon Verification of Automotive Power Devices

Pub Date : 2019-07-01 DOI: 10.1109/ITCIndia46717.2019.8979897 T. Nirmaier, Manuel Harrant, B. Eversmann, G. Pelz

GPU-HBM SiP Interconnect Link Test and Repair

Pub Date : 2019-07-01 DOI: 10.1109/ITCIndia46717.2019.8979855 Amanulla Khan, Himakiran Kodihalli, Thenappan Nachiappan, Sreekar Sreesailam, Seth Chou, Colin Lee

Improved Diagnosis Methodology for Multi-Defect Scenarios in High Compression Scan based Designs

Pub Date : 2019-07-01 DOI: 10.1109/ITCIndia46717.2019.8979700 Bharath Nandakumar, Anil Malik, Atul Chhabra, Sameer Chillarige, Wilson Pradeep, P. Narayanan

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