2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

查看最新文献

552

2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - 最新文献

Rebooting Computing: The Challenges for Test and Reliability

Pub Date : 2019-10-02 DOI: 10.1109/DFT.2019.8875270 A. Bosio, Ian O’Connor, G. Rodrigues, F. Kastensmidt, E. Vatajelu, G. D. Natale, L. Anghel, S. Nagarajan, M. Fieback, S. Hamdioui

A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively

Pub Date : 2019-10-01 DOI: 10.1109/DFT.2019.8875434 Toshinori Hosokawa, Hiroshi Yamazaki, Kenichiro Misawa, Masayoshi Yoshimura, Yuki Hirama, Masavuki Arai

State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines

Pub Date : 2019-10-01 DOI: 10.1109/DFT.2019.8875383 H. Ichihara, Y. Maeda, T. Iwagaki, Tomoo Inoue

查看全部

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。