2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET) - 最新文献
Pub Date : 2021-06-01
DOI: 10.1109/met52542.2021.00002
Pub Date : 2021-06-01
DOI: 10.1109/MET52542.2021.00017
Andrei Lascu, Matt Windsor, A. Donaldson, T. Grosser, John Wickerson
Pub Date : 2021-06-01
DOI: 10.1109/MET52542.2021.00012
Yao Deng, Guannan Lou, J. Zheng, Tianyi Zhang, Miryung Kim, Huai Liu, Chen Wang, T. Chen
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