2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages

Pub Date : 2022-10-19 DOI: 10.1109/DFT56152.2022.9962345 J. Wen, Andrea Baroni, E. Pérez, Markus Ulbricht, C. Wenger, M. Krstic

Operational Age Estimation of ICs using Gaussian Process Regression

Pub Date : 2022-10-19 DOI: 10.1109/DFT56152.2022.9962355 Anmol Singh Narwariya, Pabitra Das, S. Khursheed, A. Acharyya

Image Degradation due to Interacting Adjacent Hot Pixels

Pub Date : 2022-10-19 DOI: 10.1109/DFT56152.2022.9962368 G. Chapman, Klinsmann J. Coelho Silva Meneses, I. Koren, Z. Koren