2007 IEEE International Conference on Microelectronic Test Structures

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2007 IEEE International Conference on Microelectronic Test Structures - 最新文献

New Methodology for the Characterization of EEPROM Extrinsic Behaviors

Pub Date : 2007-03-19 DOI: 10.1109/ICMTS.2007.374455 D. Medjahed, T. Yao, D. Wojciechowski, P. Gassot, M. Yameogo

Coupling on-wafer measurement errors and their impact on calibration and de-embedding up to 110 GHz for CMOS millimeter wave characterizations

Pub Date : 2007-03-19 DOI: 10.1109/ICMTS.2007.374494 C. Andrei, D. Gloria, F. Danneville, P. Scheer, G. Dambrine

Benchmarking the PSP Compact Model for MOS Transistors

Pub Date : 2007-03-19 DOI: 10.1109/ICMTS.2007.374495 Xin Li, Weimin Wu, A. Jha, G. Gildenblat, R. Van Langevelde, G. Smit, A. Scholten, D. Klaassen, C. McAndrew, J. Watts, M. Olsen, G. Coram, S. Chaudhry, J. Victory

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