2019 IEEE International Reliability Physics Symposium (IRPS)

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2019 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

Surrogate Model Assisted Design of Silicon Anode Considering Lithiation Induced Stresses

Pub Date : 2019-05-22 DOI: 10.1109/IRPS.2019.8720601 Zhuoyuan Zheng, Bo Chen, Y. Gurumukhi, J. Cook, M. Ates, N. Miljkovic, P. Braun, Pingfeng Wang

Reinforcement Learning System Comprising Resistive Analog Neuromorphic Devices

Pub Date : 2019-05-22 DOI: 10.1109/IRPS.2019.8720428 Song-Ju Kim, Kaori Ohkoda, M. Aono, H. Shima, Makoto Takahashi, Y. Naitoh, H. Akinaga

Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs

Pub Date : 2019-05-22 DOI: 10.1109/IRPS.2019.8720568 Wang Liao, M. Hashimoto, S. Manabe, Y. Watanabe, Shin-ichiro Abe, K. Nakano, Hayato Takeshita, M. Tampo, S. Takeshita, Y. Miyake

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