2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) - 最新文献
Pub Date : 2022-10-26
DOI: 10.1109/MetroXRAINE54828.2022.9967641
A. Tramontano, Oscar Tamburis, M. Magliulo
Pub Date : 2022-10-26
DOI: 10.1109/MetroXRAINE54828.2022.9967525
Ilaria Mileti, Juri Taborri, D. Torricelli, S. Rossi, F. Patané
Pub Date : 2022-10-26
DOI: 10.1109/MetroXRAINE54828.2022.9967600
Elena Mongiardini, E. Colamarino, J. Toppi, V. D. Seta, F. Pichiorri, D. Mattia, F. Cincotti
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