2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - 最新文献
Pub Date : 2020-08-01
DOI: 10.1109/AITEST49225.2020.00015
Chaojin Wang, Jian Shen, Chunrong Fang, Xiangsheng Guan, Kaitao Wu, Jiang Wang
Pub Date : 2020-08-01
DOI: 10.1109/AITEST49225.2020.00014
D. Moreira, Ana Paula Furtado, Sidney C. Nogueira
Pub Date : 2020-08-01
DOI: 10.1109/AITEST49225.2020.00017
Hong Zhu, Ian Bayley, Dongmei Liu, Xiaoyu Zheng
查看全部