2017 IEEE International Reliability Physics Symposium (IRPS)

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2017 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction

Pub Date : 2017-06-01 DOI: 10.1109/IRPS.2017.7936419 M. Duan, J. F. Zhang, J. Zhang, W. Zhang, Z. Ji, B. Benbakhti, X.F. Zheng, Y. Hao, D. Vigar, F. Adamu-Lema, V. Chandra, R. Aitken, B. Kaczer, G. Groeseneken, A. Asenov

Vce as early indicator of IGBT module failure mode

Pub Date : 2017-06-01 DOI: 10.1109/IRPS.2017.7936371 Kristian Bonderup Pedersen, P. Kristensen, K. Pedersen, C. Uhrenfeldt, S. Munk‐Nielsen

Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials

Pub Date : 2017-04-02 DOI: 10.1109/IRPS.2017.7936335 Subrat Mishra, H. Wong, R. Tiwari, A. Chaudhary, N. Parihar, R. Rao, S. Motzny, V. Moroz, S. Mahapatra

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