2021 IEEE International Reliability Physics Symposium (IRPS)

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2021 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

New Developments in SiGe HBT Reliability for RF Through mmW Circuits

Pub Date : 2021-03-01 DOI: 10.1109/IRPS46558.2021.9405171 J. Cressler

Impact of Multilevel Retention Characteristics on RRAM based DNN Inference Engine

Pub Date : 2021-03-01 DOI: 10.1109/IRPS46558.2021.9405210 Wonbo Shim, Jian Meng, Xiaochen Peng, Jae-sun Seo, Shimeng Yu

Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects

Pub Date : 2021-03-01 DOI: 10.1109/IRPS46558.2021.9405148 P. Fiorenza, S. Adamo, M. Alessandrino, C. Bottari, B. Carbone, C. D. Martino, A. Russo, M. Saggio, C. Venuto, E. Vitanza, E. Zanetti, F. Giannazzo, F. Roccaforte

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