Advanced Device Materials

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Advanced Device Materials - 最新文献

Attaining semi-quantitative SERS measurements on thermally dewetted Au films

Pub Date : 2017-09-18 DOI: 10.1080/20550308.2017.1372096 S. Andrikaki, K. Govatsi, S. Yannopoulos, G. Voyiatzis, K. Andrikopoulos

Development of an evanescent optical integrated sensor in the mid-infrared for detection of pollution in groundwater or seawater

Pub Date : 2017-06-22 DOI: 10.1080/20550308.2017.1338211 E. Baudet, A. Gutierrez-Arroyo, M. Baillieul, J. Charrier, P. Němec, L. Bodiou, J. Lemaître, E. Rinnert, K. Michel, B. Bureau, J. Adam, V. Nazabal

Line source scattering from a step protrusion in a perfect electromagnetic conductor plane

Pub Date : 2017-05-02 DOI: 10.1080/20550308.2017.1318335 M. H. Tiwana, Shakeel Ahmed, A. B. Mann

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