2009 10th International Conference on Ultimate Integration of Silicon

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2009 10th International Conference on Ultimate Integration of Silicon - 最新文献

Quantum compact model for ultra-narrow body FinFET

Pub Date : 2009-03-18 DOI: 10.1109/ULIS.2009.4897593 Mingchun Tang, F. Prégaldiny, C. Lallement, J. Sallese

Comparison of advanced transport models for nanoscale nMOSFETs

Pub Date : 2009-03-18 DOI: 10.1109/ULIS.2009.4897554 P. Palestri, C. Alexander, A. Asenov, G. Baccarani, A. Bournel, M. Braccioli, B. Cheng, P. Dollfus, A. Esposito, D. Esseni, A. Ghetti, C. Fiegna, G. Fiori, V. Aubry-Fortuna, G. Iannaccone, A. Martinez, B. Majkusiak, S. Monfray, S. Reggiani, C. Riddet, J. Saint-Martin, E. Sangiorgi, A. Schenk, L. Selmi, L. Silvestri, J. Walczak

Modeling effect of Negative Bias Temperature Instability on potential distribution and degradation of double-gate MOSFETs

Pub Date : 2009-03-18 DOI: 10.1109/ULIS.2009.4897598 Nayereh Ghobadi, A. Afzali-Kusha, E. Asl-Soleimani

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