2011 IEEE ICMTS International Conference on Microelectronic Test Structures

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2011 IEEE ICMTS International Conference on Microelectronic Test Structures - 最新文献

A versatile defectivity monitor designed for efficient test and failure analysis

Pub Date : 2011-04-04 DOI: 10.1109/ICMTS.2011.5976855 M. Lauderdale, Brad Smith

Modeling the frequency dependence of MOSFET gate capacitance

Pub Date : 2011-04-04 DOI: 10.1109/ICMTS.2011.5976853 Zeqin Zhu, G. Gildenblat, C. McAndrew, Ik-Sung Lim

Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

Pub Date : 2011-04-04 DOI: 10.1109/ICMTS.2011.5976842 H. Kock, R. Illing, Thomas Ostermann, S. Decker, D. Dibra, G. Pobegen, S. de Filippis, M. Glavanovics, D. Pogany

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