Critical thickness for ferroelectricity in perovskite ultrathin films

待确认 10 由 wu 发布于 2026/10/26 15:10:17

DOI:10.1038/nature01501
文献类型：期刊论文
补充材料：只需要正文

Nature

Abstract：The integration of ferroelectric oxide films into microelectronic devices1,2, combined with the size reduction constraints imposed by the semiconductor industry, have revived interest in the

应助信息

等待求助人确认

求助人未确认前，本求助不能再次应助。36小时后系统将自动确认应助成功。本求助将自动关闭。

1天前

Book学术机器人

6ceb81d758d811f18d9334735aa3bc31.pdf

1天前

Book学术机器人

2026/10/26 15:10:17 Book学术AI机器人已找到文献并上传

2026/10/26 15:10:17 Book学术AI机器人收到请求，开始寻找文献

2026/10/26 15:10:17 已向机器人发送请求

1天前

wu 发布求助

上一个求助:其它数据库Naturally Fractured Carbonate Reservoir Characterization: A Case Study of a Mature High-Pour Point Oil Field in Hungary 下一个求助:American Institute of Physics (AIP)A connectivity dependent model for electrical properties of multiphase media