Evaluation methods for XPS depth profiling; A review

已完结 20 由 Σ 发布于 2026/10/30 19:35:53

DOI:10.1016/j.apsadv.2025.100872
作者：A.S. Racz,?M. Menyhard
文献类型：期刊论文
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Abstract：In recent years X-ray photoelectron spectroscopy (XPS) has become a widespread approach in modern material science to study numerous aspects (energy production, bio-interface analysis, catal

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