Electromigration failure in inkjet-printed Ag conductive lines

已完结 10 由 dandan 发布于 2026/8/7 12:20:52

DOI:10.1088/2058-8585/acb277
作者：Prabhakar Jepiti, Sukeun Yoon, Jihoon Kim
文献类型：期刊论文
补充材料：只需要正文

IOPscience

Abstract：Electromigration (EM) is crucial to the reliability of most conductive lines used in electronics. In the present study, the EM characteristics of inkjet-printed Ag conductive lines were anal

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