Crystallographic benchmarking of powder X-ray line diffraction pattern profiling of monoclinic sucrose nanocrystal

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DOI:10.1016/j.rsurfi.2025.100595
作者：Md. Khalid Hossain Shishir , Md. Mynul Islam , Md. Tarikul Islam , Md. Ashikur Rahaman , Md. Hasnain Mustak , Md. Golam Mostafa , Md. Ashraful Alam
文献类型：期刊论文
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Elsevier

Abstract：The structural and geometrical properties of sucrose were examined using powder X-ray diffraction (XRD). XRD analysis provided insights into the atomic orientation and enabled precise refine

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