Resonant enhancement of the thermoreflectance response of silicon nanodisks

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DOI:10.1063/5.0276240
作者：Xinchao Wang, Changxing Shi, Qifan Zheng, Dakotah Thompson
文献类型：期刊论文
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American Institute of Physics (AIP)

Abstract：Optical thermometry techniques enabled by a material's thermoreflectance response are widely employed for thermal imaging of microelectronic devices and measurements of thermal transport in

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