SIDEST: A sample-free framework for crop field boundary delineation by integrating super-resolution image reconstruction and dual edge-corrected Segment Anything model

已完结 10 由 Ayewei 发布于 2026/9/5 16:03:21

DOI:10.1016/j.compag.2025.109897
作者：Haoran Sun ,?Zhijian Wei ,?Weiguo Yu ,?Gaoxiang Yang ,?Junnan She ,?Hengbiao Zheng ,?Chongya Jiang ,?Xia Yao ,?Yan Zhu ,?Weixing Cao ,?Tao Cheng ,?Iftikhar Ali
文献类型：期刊论文
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Elsevier

Abstract：Digital crop field boundaries are fundamental for parcel-level cropland monitoring and precision crop management. The use of very high-resolution (VHR) remote sensing images represented a po

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