Multi-layer internal short-circuit mechanism and thermal runaway risk assessment of lithium-ion batteries using nail penetration simulation

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DOI:10.1016/j.est.2024.112824
作者：Yimao Ren, Huirou Zhang, Lei Wei, Xuning Feng, Weixiong Wu
文献类型：期刊论文
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Elsevier

Abstract：Internal short-circuit (ISC) is a common link in the chain of thermal runaway inducement of Lithium-ion batteries (LIBs), and its mechanism is not fully understood. Employing nail penetratio

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