Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range

待确认 20 由布发布于 2026/3/18 14:00:45

DOI:10.1117/12.2227580
作者：D. Franta, D. Ne?as, I. Ohlídal, A. Giglia
文献类型：期刊论文
补充材料：只需要正文

International Society for Optics and Photonics (SPIE)

Abstract：Vacuum evaporated SiO2 thin films are very important in a design and manufacturing of optical devices produced in optics industry. In this contribution a reliable and precise optical charact

应助信息

等待求助人确认

求助人未确认前，本求助不能再次应助。36小时后系统将自动确认应助成功。本求助将自动关闭。

16小时前

9wm9ldj

c3387e70229011f1b32034735aa3bc31.pdf

16小时前

Book学术机器人

2026/3/18 14:00:46 未找到该文献，机器人已退出，请等待人工下载

2026/3/18 14:00:45 Book学术AI机器人收到请求，开始寻找文献

2026/3/18 14:00:45 已向机器人发送请求

16小时前

布发布求助

上一个求助:其它数据库Naturally Fractured Carbonate Reservoir Characterization: A Case Study of a Mature High-Pour Point Oil Field in Hungary 下一个求助:Institute of Electrical and Electronics Engineers (IEEE)Rapid Manufacturing of fully-printed, miniaturised, kerfless arrays for high resolution ultrasound imaging