Recent advances in AI-aided TEM image analysis: Emerging trends and applications

已完结 10 由 MK 发布于 2026/7/21 10:29:24

DOI:10.1016/j.matdes.2026.115700
作者：Woonbae Sohn ,?Hionsuck Baik ,?Hyojung Kim
文献类型：期刊论文
补充材料：只需要正文

Elsevier

Abstract：Artificial intelligence (AI) is revolutionizing the analysis of (scanning) transmission electron microscopy ((S)TEM) data by enabling high-throughput, objective, and scalable interpretation

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