An Extensive analysis of the Janus Si2XY (X, YP, As, Sb, Bi): Optical and biaxial strain dependent electronic properties

已完结 20 由 111 发布于 2025/7/31 12:51:51

DOI:10.1016/j.ssc.2024.115599
作者：Priyankaben N. Thorat ,?Aparnakumari M. Patel ,?Rahulkumar P. Jadav ,?Radha N Somaiya ,?Yogesh Sonvane
文献类型：期刊论文
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Elsevier

Abstract：In the 2D materials field, Si2XY Janus monolayers have gained more attention with the help of their distinct optical and electronic properties. The Ab Initio Molecular Dynamics (AIMD) method

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