Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models

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DOI:10.1109/APWCS60142.2023.10234059
作者：Chuan-Shiuan Liang, Zhenyu Xu, Jian-Yu Zhou, Chieh-Ming Yang, Jen-Yeu Chen
文献类型：期刊论文
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Institute of Electrical and Electronics Engineers (IEEE)

Abstract：Traditional methods of coffee bean inspection mainly rely on manual labor, which results in issues such as low efficiency and subjectivity. However, with the advancement of computer vision a

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