Phase measuring deflectometry based microscopy for shape visualization and thickness quantification

已完结 10 由宝宝巴士发布于 2025/8/25 11:28:59

DOI:10.1016/j.optlastec.2025.113524
作者：Shivam Sharma ,?Vismay Trivedi ,?Swapnil Mahajan ,?Gyanendra Sheoran ,?Bahram Javidi ,?Arun Anand
文献类型：期刊论文
补充材料：只需要正文

Elsevier

Abstract：Shape profiling and thickness information of living cells can provide critical insights about the cells, which can help in their identification and characterization. Most living cells are di

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