Suppression of Leakage Currents in Photo-multiplication Photodetectors with Oxidation-Controlled Metal Interfacial Layer

已完结 10 由 e 发布于 2025/4/14 19:37:32

DOI:10.1007/s13391-023-00429-0
作者：Seong Bin Lim, Ji-Young Lee, Tae Hun Lim, Seri Lee, Seung Ho Lee, Gyu Min Kim, Se Young Oh
文献类型：期刊论文
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Springer

Abstract：In this work, we investigate the use of annealed metal oxides in electron blocking layer (EBL) of photo-multiplication organic photodetectors (PM-OPD), to obtain low leakage current, high ex

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