Thick p-type Mg2Si film on Si: Growth, structure and transport properties

已完结 10 由 11122 发布于 2025/6/2 16:42:56

DOI:10.1016/j.jallcom.2023.171301
作者：Igor M. Chernev ,?Evgenii Yu. Subbotin ,?Aleksei G. Kozlov ,?Andrey V. Gerasimenko ,?Alexander Yu. Ustinov ,?Nikolay G. Galkin ,?Maksim V. Poliakov ,?Lidiya S. Volkova ,?Alexander A. Dudin ,?Alexander
文献类型：期刊论文
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Elsevier

Abstract：A ∼ 0.8–0.9 µm thick Mg2Si film was grown by pulsed deposition of Mg on Si(111) at 340 °C in UHV. The X-Ray Diffraction (XRD) and cross-sectional High-resolution Transmission Electron Micros

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