Large depth-of-field fringe projection profilometry applied to defocused scenes.

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DOI:https://hub.uu2025.xyz/10.1109/RAST57548.2023.10197925
文献类型：期刊论文
补充材料：只需要正文
文献链接：https://doi.org/10.1364/OE.519459

Institute of Electrical and Electronics Engineers (IEEE)

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