Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis

已完结 10 由 dama 发布于 2024/11/11 14:52:01

DOI:10.1177/0309324711405761
作者：J. Bernier,?Nathan R. Barton,?U. Lienert,?Matthew P. Miller
文献类型：期刊论文
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Abstract：The far-field high-energy diffraction microscopy technique is presented in the context of high-energy synchrotron x-ray diffraction. For each grain in an illuminated polycrystalline volume,

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