Demonstration of Highly Manufacturable STT-MRAM Embedded in 28nm Logic

已完结 10 由 bit5i54 发布于 2024/11/7 8:50:45

DOI:10.1109/IEDM.2018.8614635
作者：Y. Song, J. Lee, Sung-hee Han, H. Shin, K. H. Lee, K. Suh, D. Jeong, G. Koh, Sechung Oh, Joon-Min Park, Soojeoung Park, B. Bae, O. I. Kwon, K. Hwang, Bum-seok Seo, You Kyoung Lee, S. Hwang, Dongsoo Le
文献类型：期刊论文
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文献链接：https://doi.org/10.1109/IEDM.2018.8614635

Institute of Electrical and Electronics Engineers (IEEE)

Abstract：We successfully demonstrated the manufacturability of 8Mb STT-MRAM embedded in 28nm FDSOI logic platform by achieving stable functionality and robust package level reliability. Read margin w

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