镱磁光阱的功率相关损耗

T. Loftus, J. Bochinski, R. Shivitz, T. Mossberg
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引用次数: 24

摘要

只提供摘要形式。利用555.6 nm (6s/sup 2/)/sup 1/S/sub 0/-(6s6p)/sup 3/P/sub 1/互组合线的强跃迁促进了Yb的磁光捕获。然而,这条线并不是辐射闭合的,一些衰变通道终止于亚稳态,导致磁光捕获(MOT)的寿命取决于冷却跃迁上层的原子比例。我们描述了陷阱寿命与陷阱光束功率的定量研究,补充了早期的预测和定性实验结果。我们的工作构成了首次使用MOT损失率来测量激发态辐射分支比。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Power dependent loss from a ytterbium magneto-optic trap
Summary form only given. Magneto-optic trapping of Yb is facilitated by use of a strong transition of the 555.6 nm (6s/sup 2/)/sup 1/S/sub 0/-(6s6p)/sup 3/P/sub 1/ inter-combination line. This line is not radiatively closed, however, and some the decay channels terminate in metastable states, resulting in magneto-optic trapping (MOT) lifetimes that depend on the fraction of atoms in the upper level of the cooling transition. We describe a quantitative study of trap lifetime versus trapping beam power that complements earlier predictions and qualitative experimental results. Our work constitutes the first use of MOT loss rates to measure an excited-state radiative branching ratio.
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