6H-SiC(0001)表面的AFM研究

Shouzhen Jiang , Guangwei Yu , Yingmin Wang , Xiaobo Hu , Xiangang Xu , Minhua Jiang
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引用次数: 1

摘要

用原子力显微镜(AFM)研究了6H-SiC(0001)表面的微管和阶梯结构。在表面上,所有被检查的微管都是螺旋台阶的起源,表明位错在这些点上与表面相交。微管是弗兰克最初描述的空核超位错。微管半径随位错Burgers矢量的平方而增大。从中心到外围,台阶结构随表面倾角的不同而变化。在中央多面区域内观察到有规律的台阶。在外围凸区观察到台阶聚束和原子粗糙表面。如果相对于(0001)平面的倾角足够大,则可以观察到15R-SiC的阶跃聚束。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of the 6H-SiC (0001) surface by AFM

Micropipe and step structures on 6H-SiC (0001) surface were investigated by an atomic force microscopy (AFM). On the facet, all micropipes examined are the origins of spiral steps, indicating that dislocations intersect the surface at these points. Micro-pipes are empty-core super-dislocations as originally described by Frank. The micropipe radius increases with the square of the dis-location Burgers vector. From the center to the periphery, step structures change with different surface inclinations. Regular step is observed within the central faceted area. Step bunching and atomically rough surfaces are observed within the peripheral convex area. If the inclination with respect to the (0001) plane is large enough, step bunching of 15R-SiC can be observed.

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